TQ6410裸机测试程序

小弟想问一下，如何根据光盘里给的三星原厂资料里的裸机测试代码包6410_Test_Rev02来写自己的测试程序？比如说，写一个最简单的LED流水灯的程序？

参考里面寄存器的操作，点亮和熄灭二极管，然后在循环里面，循环点亮和熄灭二极管，中间加延时。

TQ_guoxixiao 发表于 2012-3-1 09:34
参考里面寄存器的操作，点亮和熄灭二极管，然后在循环里面，循环点亮和熄灭二极管，中间加延时。

具体的测试代码我会写，我想问的是，我要添加哪些头文件进去我的程序。还有，我用dnw向板子里下载bin文件的时候，老是不成功：
Now, Downloading [ADDRESS:0xc0000000,TOTAL:0x7e06f8]
Please waiting ..............................................................................................................................Download Done!!
Download Address: 0xc0000000, Download Filesize:0x7e06f8
Checksum is being calculated........
Checksum O.K.

NAND erase: device 0 whole chip
Skipping bad block at  0x01220000                                            
Skipping bad block at  0x02ce0000                                            
Skipping bad block at  0x03b60000                                            
Skipping bad block at  0x07360000                                            
Skipping bad block at  0x08e00000                                            
Skipping bad block at  0x09ac0000                                            
Skipping bad block at  0x09d20000                                            
Skipping bad block at  0x0f260000                                            
Erasing at 0xffe0000 -- 100% complete.
OK

NAND write: device 0 whole chip

Bad block at 0x1220000 in erase block from 0x1220000 will be skipped
Bad block at 0x2ce0000 in erase block from 0x2ce0000 will be skipped
Bad block at 0x3b60000 in erase block from 0x3b60000 will be skipped
Bad block at 0x7360000 in erase block from 0x7360000 will be skipped
Bad block at 0x8e00000 in erase block from 0x8e00000 will be skipped
Bad block at 0x9ac0000 in erase block from 0x9ac0000 will be skipped
Bad block at 0x9d20000 in erase block from 0x9d20000 will be skipped
Bad block at 0xf260000 in erase block from 0xf260000 will be skipped
Writing data at 0xfe70800 --  99% complete.
Data did not fit into device, due to bad blocks
268435456 bytes written: ERROR